Vision Engineering Swift Duo Dual Optical & Video Measuring System

The Swift-Duo has a measuring stage range of 200 × 100 mm (X × Y) as its standard configuration. The system can handle a maximum part/load weight of 10 kg.

Yes — there is a 3-axis variant available that includes Z-axis measurement. The height adjustment for the optical/video head is approximately 100 mm.

Encoder resolution in the X and Y axes is 1 µm. For the 3-axis variant (when Z is included), Z encoding is also at 1 µm resolution.

The system supports quick-change magnification via objective lenses offering 10×, 20×, 50×, and 100× total magnification. It uses Vision Engineering’s patented twin-pupil, infinity-corrected optical system with a pre-centred crossline graticule to both eyes.

Swift-Duo provides multiple illumination options: surface illumination using an LED surface light (with corrected colour-temperature LEDs) or twin semi-coaxial spot lamps. Substage (transmitted / back-light) illumination is also supported to allow edge detection in profile or through translucent materials. This variety helps in handling different part textures, colours or contrast levels.

The system uses “Touch-to-Measure” / “Touch2Measure” generation software, which allows multi-touch interaction (e.g. touch, swipe, pinch to zoom). The software is aimed at ease-of-use for both shift-level operators and advanced users. There is minimal setup required, and training times are lower compared to more complex measurement systems.

All measuring stages are factory calibrated using Non-Linear Error Correction (NLEC). This means that errors across the travel of the stage are mapped and corrected in software, improving accuracy across the full range rather than only at centre positions.

• Though the Swift-Duo covers a generous measurement area and provides dual-mode measurement, very large or bulky parts that exceed the X-Y stage or Z-height will not be measurable in one piece.
• Very high magnification (e.g., 100×) reduces field of view significantly, making alignment and part positioning more critical.
• While video edge detection works well for many features, very low contrast, transparent, or reflective materials may still require optical microscope mode to accurately identify edges.
• Choosing the right lighting, optics and possibly accessories (like filtered or spot lighting) will influence measurement quality; there is cost in configuring the system optimally.