Zero Ion Ionic Contamination Tester

The Zero Ion G3 uses Resistivity of Solvent Extract (ROSE) testing and dynamic measurement technology to meet the latest industry standards. It provides precise measurements in compliance with IPC J-STD-001J and IPC-TM-650 2.3.25 to ensure PCB assemblies are free from harmful ionic residues.

Unlike static testers that can suffer from “saturation limit effect,” the Zero Ion’s dynamic filtering technology continuously re-deionizes the test solution during the process. This maintains high solvent sensitivity, allowing it to detect even weak ion activators common in no-clean solder paste residues.

Yes. It the Zero Ion Ionic Contamination Tester is specifically designed to handle no-clean fluxes and other modern soldering materials. The combination of submerged spray jets and dynamic filtration ensures that all soluble contamination is extracted and accurately measured.

The Zero Ion was found by the U.S. Naval Air Weapons Center (NAWC) to be the most sensitive ionic contamination tester evaluated—3.7 times more sensitive than manual ROSE tests. It is specifically cited in MIL-STD-2000A and meets MIL-P-28809 and NASA-STD-8739.1B requirements.

The Zero Ion G3 performs all tests at ambient temperature, which eliminates the need for a solution heater. This provides significant cost savings by reducing power consumption, machine startup times, and solution evaporation while also improving safety by removing flammable hazard risks associated with heated solvents.

The unit’s Windows PC-based control system includes built-in SPC data recording. Users can search the database by date range, recipe name, or board serial number and can network the device for remote viewing of SPC data or save results as PDFs.