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The Saki Inline 3D-CT AXI 3Xi-M110 is a high-speed 3D X-ray inspection system designed for advanced electronics X-ray inspection across SMT and through-hole processes. As a next-generation PCB X-ray machine, it delivers true volumetric 3D-CT imaging to detect a wide range of hidden defects, including BGA void inspection, solder joint issues, and faults in high-density assemblies.
With excellent Z-axis separability, continuous high-definition 3D capture, and unique high-speed CT processing, the 3Xi-M110 provides more accurate results than conventional PCB defect detection X-ray machines. A wider detector, lighter platform, and smaller footprint improve inline operability, while reduced exposure and comprehensive self-diagnostics ensure reliable long-term performance.
Engineered for speed, precision, and ease of use, the 3Xi-M110 sets a new benchmark for automated 3D X-ray inspection in modern PCB manufacturing.
Join Hawker Richardson’s team for a practical session designed for production managers and quality engineers evaluating X-ray inspection technology.
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This product is available to view in our virtual demo.
Click to the right if you’d like to see the product in-situ within an SMT line, where you can also view a 3D file and watch a short video introduction.
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| MODEL | 3Xi-M110 |
| Resolution | 10µm – 30µm / 8µm – 30µm (Wide Image Flat Panel Detector, Optional) |
| PCB Size mm (in.) | 50W x 120L – 360W x 330L (1.97W x 4.73L – 14.17W x 12.99L) 50W x 120L – 360W x 510L (1.97W x 4.72L – 14.17W x 20.07L) |
| PCB Thickness | 0.8mm – 4.0mm (0.031 – 0.157 in.) |
| Warpage | 2mm (0.08 in.) or less |
| PCB Clearance | Top: 60mm (2.36 in.) Bottom: 40mm (1.57 in.) |
| Inspection Categories | Chip Type Parts, Diodes, Tantalum Capacitors, Aluminium Electrolytic Capacitors, Module Chips, Transistors, Power Transistors, Connectors, QFP, SOP, CSP, QFN, and BGA |
| Detector | Flat Panel Detector / Wide Image Flat Panel Detector (Optional) |
| X-ray Source Type | 110kV 30W, Closed X-ray Source |
| X-ray Leakage | 0.5µSv/h or less |
| Transfer Conveyor Method | Flat belt transfer |
| Transfer Conveyor Height | 880 – 920mm (34.65 – 36.22 in.) |
| Transfer Conveyor Width Adjustment | Auto Width Adjustment |
| PC Specification OS | Windows 10 IoT Enterprise2019 EMB 64bit (Microsoft) |
| Usage Environment | 15°C (59F) – 30°Cng (86F) / 15 – 80%RH (Non-condensi) |
| Electric Power Requirement | Three – Phase ~ 200 +/-10%, 50/60Hz, 4.2kVA |
| Air Requirement | 0.5 MPa, 20 L/min (ANR) |
| Noise Level | 70.0 dB or less |
| Dimensions W x D x H (Main Body) | 1380 x 2150 x 1500mm (54.34 x 84.65 x 59.06 in) |
| Weight (Main Body) | Aprox. 3,100 kg (6834.34 lbs) |
| MODEL | 3Xi-M110 |
| Resolution | 10µm – 30µm / 8µm – 30µm (Wide Image Flat Panel Detector, Optional) |
| PCB Size mm (in.) | 50W x 120L – 360W x 330L (1.97W x 4.73L – 14.17W x 12.99L) 50W x 120L – 360W x 510L (1.97W x 4.72L – 14.17W x 20.07L) |
| PCB Thickness | 0.8mm – 4.0mm (0.031 – 0.157 in.) |
| Warpage | 2mm (0.08 in.) or less |
| PCB Clearance | Top: 60mm (2.36 in.) Bottom: 40mm (1.57 in.) |
| Inspection Categories | Chip Type Parts, Diodes, Tantalum Capacitors, Aluminium Electrolytic Capacitors, Module Chips, Transistors, Power Transistors, Connectors, QFP, SOP, CSP, QFN, and BGA |
| Detector | Flat Panel Detector / Wide Image Flat Panel Detector (Optional) |
| X-ray Source Type | 110kV 30W, Closed X-ray Source |
| X-ray Leakage | 0.5µSv/h or less |
| Transfer Conveyor Method | Flat belt transfer |
| Transfer Conveyor Height | 880 – 920mm (34.65 – 36.22 in.) |
| Transfer Conveyor Width Adjustment | Auto Width Adjustment |
| PC Specification OS | Windows 10 IoT Enterprise2019 EMB 64bit (Microsoft) |
| Usage Environment | 15°C (59F) – 30°Cng (86F) / 15 – 80%RH (Non-condensi) |
| Electric Power Requirement | Three – Phase ~ 200 +/-10%, 50/60Hz, 4.2kVA |
| Air Requirement | 0.5 MPa, 20 L/min (ANR) |
| Noise Level | 70.0 dB or less |
| Dimensions W x D x H (Main Body) | 1380 x 2150 x 1500mm (54.34 x 84.65 x 59.06 in) |
| Weight (Main Body) | Aprox. 3,100 kg (6834.34 lbs) |
The 3d x ray inspection system delivers resolution in the range of approximately 10 µm to 30 µm using standard detectors, and optional wide-image flat panel detectors may allow better resolution or less field-of-view trade-offs.
It is designed for detecting a full spectrum of solder defects including voids, head-in-pillow (HiP), PTH (through-hole) solder issues, excessive or deficient fillets, shorts & bridges, misalignment, etc. The Planar CT (3D volumetric) imaging allows separating layers and detecting hidden defects.
Planar CT captures multiple projection images from different angles, reconstructs high-definition cross-section (“slice”) images, then stacks or composes them to a full 3D volumetric model. This allows better Z-axis separation (top-side vs bottom-side), clearer edges under components, and fewer false negatives due to shadows or overlapping features.
Throughput is improved via: